4

X-ray photoelectron spectra of lead oxides

Year:
1973
Language:
english
File:
PDF, 618 KB
english, 1973
7

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

Year:
2015
Language:
english
File:
PDF, 4.10 MB
english, 2015
9

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

Year:
2018
Language:
english
File:
PDF, 4.89 MB
english, 2018
11

Shadow-cone-enhanced secondary-ion mass-spectrometry studies of Ag{110}

Year:
1989
Language:
english
File:
PDF, 405 KB
english, 1989
15

Carbon monoxide adsorption and desorption on Rh{111} and Rh{331} surfaces

Year:
1984
Language:
english
File:
PDF, 53 KB
english, 1984
18

Carbon monoxide adsorption and desorption on Rh{111} and Rh{331} surfaces

Year:
1984
Language:
english
File:
PDF, 940 KB
english, 1984
27

Molecular desorption and secondary ion mass spectrometry

Year:
2001
Language:
english
File:
PDF, 228 KB
english, 2001
28

Depth Profiling of Peptide Films with TOF-SIMS and a C 60 Probe

Year:
2005
Language:
english
File:
PDF, 794 KB
english, 2005
44

ions desorbed by 3-keV ion bombardment of GaAs(110)

Year:
1990
Language:
english
File:
PDF, 536 KB
english, 1990
48

Molecular Depth Profiling by Wedged Crater Beveling

Year:
2011
Language:
english
File:
PDF, 3.36 MB
english, 2011